1. Needs development: negotiation and presentation for success
المؤلف: / John C. Ritchie
المکتبة: سازمان اسناد و كتابخانه ملی جمهوری اسلامی ایران (طهران)
موضوع: Business presentations,Negotiation in business
رده :
HD
۵۸
/
۶
/
ر
۹
ن
۹
H
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2. Scanning Electron Microscopy and X-Ray Microanalysis /
المؤلف: by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
المکتبة: کتابخانه مطالعات اسلامی به زبان های اروپایی (قم)
موضوع: Materials science.,Measurement.,Microscopy.,Physical measurements.,Spectrum analysis.,Biological Microscopy.,Characterization and Evaluation of Materials.,Materials science.,Materials Science.,Measurement Science and Instrumentation.,Measurement.,Microscopy.,Physical measurements.,Spectroscopy and Microscopy.,Spectroscopy.,Spectroscopy/Spectrometry.,Materials science.,Measurement.,Microscopy.,Physical measurements.,Spectrum analysis.
رده :
TA404
.
6
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3. Scanning electron microscopy and x-ray microanalys
المؤلف: Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
المکتبة: کتابخانه مرکز پژوهش متالورژی رازی (طهران)
موضوع: ، Scanning electron microscopy,، Microscopy, Electron, Scanning,، Scanning electron microscopy
رده :
QH
212
.
S3
S29
2018
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4. Scanning electron microscopy and x-ray microanalysis /
المؤلف: Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
المکتبة: کتابخانه مطالعات اسلامی به زبان های اروپایی (قم)
موضوع: Scanning electron microscopy.,Biology, life sciences.,Mensuration & systems of measurement.,Scanning electron microscopy.,Science-- Life Sciences-- General.,Science-- Spectroscopy & Spectrum Analysis.,Science-- Weights & Measures.,Spectrum analysis, spectrochemistry, mass spectrometry.,Technology & Engineering-- Material Science.,Testing of materials.
رده :
QH212
.
S3
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5. Scanning electron microscopy and x-ray microanalysis /
المؤلف: Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
المکتبة: کتابخانه مطالعات اسلامی به زبان های اروپایی (قم)
موضوع: Scanning electron microscopy.,Microscopy, Electron, Scanning.,Scanning electron microscopy.,Science.
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